Contracted service for ion milling processing | JTL
We will produce cross-sectional samples without any taper using the ion milling method.
We will perform precise sample preparation necessary for high-magnification observation using the ion milling method for cross-sectional processing. In conventional mechanical polishing using polishing paper and abrasives, issues such as deformation due to stress during polishing, collapse of voids, and cracking could occur. Even for samples prone to such phenomena, by performing polishing with a very weak ion beam, we can produce cross-sectional samples suitable for high-magnification observation and analysis of micro-regions, as well as crystal orientation analysis (EBSD).
- Company：JAPAN TESTING LABORATORIES
- Price：Other
